Testing and certification platform
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Reliability testing and certification
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Failure analysis
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ATE Testing Development
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Information Security
Assist fabless in fulfilling their vehicle specification experiment requirements.
Screening qualified solution suppliers for OEM.
Provide all-round failure analysis technical services.
Offering professional failure analysis solutions for 10 major categories of chips.
Possessing industry mainstream ATE test equipment, covering analog, digital, and mixed signal chip testing.
Possessing mainstream ATE test development capabilities, including hardware design, program development, data analysis, etc.
Reduce chip information security R&D risks and costs, and improve R&D technology and efficiency.
Provide full life cycle protection for the research and development, verification, production and testing of chip information security capabilities.
Possess the industry's mainstream ATE test platform and three-temperature handler
Machine types cover analog, digital, mixed signal testing.
The machines cover all aspects from high-end to mid-range and low-end, and you can choose the appropriate platform according to customer needs.
Capable of full-platform testing and development
Test hardware design and production (L/B, Socket, Kit, etc.)
ATE test program development.
The machines cover all aspects from high-end to mid-range and low-end, and Providing customized test solution according to customer’s requirement.
ATE test data parameter level analysis and comparison.
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Advantest V93K -
ACCO STS8200 -
Chroma3380 -
长川C6100TS
Reliability Testing Equipment Reference
Possessing complete automotive reliability testing capabilities, covering various test items such as AEC-Q100, AEC-Q101, AQG324, etc.
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Reliability Ultrasonic Scanning System -
Power Temperature Cycle / PTC -
ESD and Latch-Up Testing System / CDM -
HTOL Test Chamber -
Low Temperature Burn-In Chamber -
High Temperature Dynamic Life Testing System -
Highly Accelerated Environment Test Chamber -
Heat Flow Soldering System
Automotive-Grade Chip Testing Service Process
Three major certification standards for auto IC
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IATF 16949
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ISO 26262
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AEC-Q100
Automotive-Grade Chip Certification Process
(Taking AEC-Q100 as an Example)
AEC-Q100 testing and certification
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AEC-Q100AEC-Q100
Integrated circuit IC
42 items, 7 Groups
A
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AEC-Q101AEC-Q101
Discrete semiconductor devices
31 items, 5 Groups
B
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AEC-Q102AEC-Q102
LED/Optical Diode
28 items
C
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AEC-Q103AEC-Q103
Passive components 33 items
MEMS microphone device 13 items
D
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AEC-Q104AEC-Q104
Multi - Chip Module (MCM)
49 items
E
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AEC-Q200AEC-Q200
Passive components
33 items
F
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G
AEC-Q100 Auto IC Product Qualification Process
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Test Group F
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Test Group C
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Test Group D
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Test Group E
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Test Group A
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Test Group B
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Test Group E
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Test Group H
